The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Nov. 20, 2007
Ryou Kimura, Osaka, JP;
Takayuki Arai, Nagoya, JP;
Yasuharu Kase, Nagoya, JP;
Kiyoshi Kawarazaki, Anjo, JP;
Ryou Kimura, Osaka, JP;
Takayuki Arai, Nagoya, JP;
Yasuharu Kase, Nagoya, JP;
Kiyoshi Kawarazaki, Anjo, JP;
Digital Fashion Ltd., , JP;
Toyota Tsusho Corporation, , JP;
Abstract
To provide a rendering program, a rendering apparatus, and a rendering method, which are capable of displaying a sterical model surface using a fabric in which the real feel of material is reproduced. A reflection property measurement devicereceives reflected light of an actual yarn Tand measures a reflection property representing the energy of the reflected light of the yarn T. A correction portioncalculates a specular reflection coefficient K, a glossiness coefficient p, and first and second diffuse reflection coefficients K, Kby using parameter fitting so that the error between the reflection property of the actual yarn and the energy of the reflected light obtained from a reflection function becomes minimum. A rendering portionrenders the sterical model by using the reflection function in which the coefficients are calculated and a texture which is the model of a fabric subjected to a napping treatment.