The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Sep. 15, 2010
Paola Zepeda, Chandler, AZ (US);
David E. Duarte, Portland, OR (US);
Gregory F. Taylor, Portland, OR (US);
Atul Maheshwari, Portland, OR (US);
Paola Zepeda, Chandler, AZ (US);
David E. Duarte, Portland, OR (US);
Gregory F. Taylor, Portland, OR (US);
Atul Maheshwari, Portland, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
In one embodiment, an analog-to-digital conversion in an integrated circuit is evaluated by an on-die testing circuit. For example, the on-die test circuitcan characterize one or both of the linearity and monotonicity of the digital-to-analog conversion. The value of a conversion output for a digital input code may be compared to the value of a prior conversion output of a prior step to provide digital difference values for each step of a sweep of digital input codes. Digital difference values may be compared to one or more predetermined limits to provide one or more pass/fail tests on-board the die. Other embodiments are described and claimed.