The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Feb. 08, 2008
Yuichi Negami, Ayase, JP;
Akihide Egawa, Ebina, JP;
Hiroyuki Tsuda, Ebina, JP;
Tsuyoshi Sato, Atsugi, JP;
Takuma Goto, Atsugi, JP;
Yuichi Negami, Ayase, JP;
Akihide Egawa, Ebina, JP;
Hiroyuki Tsuda, Ebina, JP;
Tsuyoshi Sato, Atsugi, JP;
Takuma Goto, Atsugi, JP;
Anritsu Corporation, Atsugi-shi, JP;
Abstract
A communication test device can assist in identifying a cause of the change in throughput of a mobile communication terminal. The device includes accumulating means for accumulating trace data on a specific unit of data complying with a designated communication standard, and throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal, extracting means for extracting trace data and throughput data from the accumulating means, trace display means for displaying trace data on a display unit, throughput display means for displaying a graph of the variation with time of throughput on the display unit, and time obtaining means for obtaining a time. The extracting means is adapted to extract, from the accumulating means, trace data corresponding to time designated by an operating unit. The trace display means displays the trace data corresponding to the time on the display unit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile