The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2012
Filed:
Dec. 22, 2006
Bradford Morse, Syracuse, NY (US);
Thomas Eldred Lambdin, Auburn, NY (US);
Clark A. Bendall, Syracuse, NY (US);
Edward B. Hubben, Skaneateles, NY (US);
Thomas W. Karpen, Skaneateles, NY (US);
Bruce A. Pellegrino, Far Hills, NJ (US);
Bradford Morse, Syracuse, NY (US);
Thomas Eldred Lambdin, Auburn, NY (US);
Clark A. Bendall, Syracuse, NY (US);
Edward B. Hubben, Skaneateles, NY (US);
Thomas W. Karpen, Skaneateles, NY (US);
Bruce A. Pellegrino, Far Hills, NJ (US);
GE Sensing & Inspection Technologies, LP, Schenectady, NY (US);
Abstract
An inspection apparatus can include an application guiding an inspector in the performance of an inspection. The application can be provided in such form as to be modified. In one embodiment, an application for guiding an inspector can be modified responsively to data collected by an inspection apparatus of an inspection system. In one embodiment an application for guiding an inspector can be modified responsively to data output by a data output device.