The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8310257 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 13, 2012

Filed:

Aug. 04, 2010
Applicants:

Shinichiro Takase, Nirasaki, JP;

Kunihiro Furuya, Nirasaki, JP;

Jun Mochizuki, Nirasaki, JP;

Inventors:

Shinichiro Takase, Nirasaki, JP;

Kunihiro Furuya, Nirasaki, JP;

Jun Mochizuki, Nirasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A plurality of metal plates and an insulating plate having a polished surface are laminated in a probe supporting plate. Through-holes into which probes are to be inserted are respectively formed in the metal plates and the insulating plate. Diameters of the through-holes are greater than diameters of the through-holes, and the through-holes pass through the probe supporting plate in a thickness direction of the probe supporting plate. Hollow portions passing through the probe supporting plate in the thickness direction of the probe supporting plate are formed in the probe supporting plate. Each of the hollow portions is formed by connecting each of holes formed in each of the metal plates and each of holes formed in the insulating plate. Diameters of holes of a metal plate that is an uppermost layer, holes of a metal plate that is a lowermost player, and holes of a metal plate that is one of intermediate layers are less than diameters of holes of metal platesthat are the other intermediate layers.


Find Patent Forward Citations

Takase, Shinichiro. (2012). Contact structure for inspection (U.S. Patent No. 8310257). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8310257

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