The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Mar. 25, 2009
Applicants:

Tommy Bourgelas, Québec, CA;

Benoit Lepage, Québec, CA;

Inventors:

Tommy Bourgelas, Québec, CA;

Benoit Lepage, Québec, CA;

Assignee:

Olympus NDT, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01);
U.S. Cl.
CPC ...
Abstract

An intelligent eddy current array probe comprising a plurality of coil elements and an embedded non-volatile memory element is disclosed. Prior to coupling the intelligent eddy current array probe to an NDI system, a data table describing a desired firing sequence for the array probe within a given inspection operation is created. This data table is then stored within the embedded non-volatile memory element of the intelligent eddy current array probe such that when the array probe is coupled to the NDI system, the elements of the NDI system can load and execute the stored firing sequence without operator intervention. In this way, a plurality of intelligent eddy current array probes, each with its own firing sequence, can be used interchangeably within a single NDI system without the need for mechanical adjustments to the NDI system.


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