The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8305576 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 06, 2012

Filed:

May. 13, 2010
Applicants:

Kazuaki Ohkubo, Kusatsu, JP;

Shunsuke Mishima, Koka, JP;

Inventors:

Kazuaki Ohkubo, Kusatsu, JP;

Shunsuke Mishima, Koka, JP;

Assignee:

Otsuka Electronics Co., Ltd., Hirakata-Shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a total luminous flux measurement apparatus according to an embodiment, a total luminous flux emitted by an object is calculated based on a result of measuring illuminances using a measuring unit when providing relative movement between the object and an integrating unit to expose a substantially entire light emitting surface of the object to an inner space of the integrating unit. Specifically, under conditions that the object is disposed to penetrate the integrating unit from one sample hole to the other sample hole, a luminous flux of a portion of the object within the inner space of the integrating unit is measured, then the integrating unit is moved relative to the object, and a luminous flux of a portion accordingly contained in the inner space of the integrating unit is measured.


Find Patent Forward Citations

Ohkubo, Kazuaki. (2012). Apparatus and method for measuring total luminous flux (U.S. Patent No. 8305576). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8305576

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