The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

Apr. 22, 2010
Applicants:

Yoav Hollander, Kiryat-Ono, IL;

Yael Feldman, Neve-Monosson, IL;

Inventors:

Yoav Hollander, Kiryat-Ono, IL;

Yael Feldman, Neve-Monosson, IL;

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computerized method of characterizing a DUV includes executing in a verification environment (VE) a set of verification tests to stimulate the DUV to collect test results from the DUV. The method further includes collecting a set of failure data for the test results; and generating sets of common failures based on clusters of features of interest in the set of failure data. The method further includes generating a set of hints from the common failures; wherein the hints indicate a potential failure mode or a potential root cause failure of the DUV for the test results for the simplified set of tests; and generating a set of debug data from the clusters of features of interest. The method further includes transferring the set of hints and the set of debug data to a user computer for storage, display, and use in an interactive debug session of the DUV.


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