The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

Jun. 16, 2004
Applicants:

Brian T. Denton, Winooski, VT (US);

Cuc K Huynh, Jericho, VT (US);

Shreesh S. Tandel, South Burlington, VT (US);

Steven H. Voldman, South Burlington, VT (US);

Inventors:

Brian T. Denton, Winooski, VT (US);

Cuc K Huynh, Jericho, VT (US);

Shreesh S. Tandel, South Burlington, VT (US);

Steven H. Voldman, South Burlington, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G05B 13/02 (2006.01); H01L 21/00 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scheduling optimizer system, method and program product that analyzes a device for sensitivities, such as ESD sensitivities, and allows for modification of a floor schedule of the assembly unit of the device based on the sensitivity of the device while improving the overall performance of the assembly unit are disclosed. The scheduling optimizer analyzes sensitivity data for a device during operation of the assembly unit on the floor schedule. The floor schedule is then optimized based on the analyzed sensitivity data.


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