The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

Jul. 06, 2009
Applicants:

Gerald Yin, Shanghai, CN;

Jinyuan Chen, Shanghai, CN;

Tuqiang NI, Shanghai, CN;

Inventors:

Gerald Yin, Shanghai, CN;

Jinyuan Chen, Shanghai, CN;

Tuqiang Ni, Shanghai, CN;

Assignee:

Advanced Micro-Fabrication Equipment, Inc. Asia, Georgetown, Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/54 (2006.01); C23F 1/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A decoupled capacitive CVD reactor is described, which provides improved CVD capabilities, including processing at lower temperatures, performing alternating deposition and etching steps, and performing in situ cleaning of the chamber, without the need for a remote plasma source. Two RF frequencies are coupled to the susceptor, while the anode is grounded. The high frequency RF source is operated so as to control the plasma density, while the low frequency RF source is operated to control species bombardment on the substrate, so as to control the properties of the film being deposited. Additionally, both RF sources may be controlled, together with selection of gasses supplied to the chamber, to operate the chamber either in deposition mode, partial etch mode, etching mode, or cleaning mode.


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