The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Nov. 17, 2010
Applicants:

Michael David Amundson, Oronoco, MN (US);

Craig Marshall Darsow, Rochester, MN (US);

Eldon Gale Nelson, Rochester, MN (US);

Dennis Martin Rickert, Rochester, MN (US);

Inventors:

Michael David Amundson, Oronoco, MN (US);

Craig Marshall Darsow, Rochester, MN (US);

Eldon Gale Nelson, Rochester, MN (US);

Dennis Martin Rickert, Rochester, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 9/455 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, system and computer program product are provided for implementing spare latch placement quality (SLPQ) determination in a floor plan design of an integrated circuit chip. A spare latch placement quality (SLPQ) metric data function is defined and compared to a spare latch placement input with a series of calculations performed. The spare latch placement quality (SLPQ) determination is made based upon the compared SLPQ metric data function and the spare latch placement input. Then associated reports including textual and visual reports are generated responsive to the SLPQ determination. In addition, a new spare latch placement can be constructed with an algorithm responsive to the SLPQ determination.


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