The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8293490 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 23, 2012

Filed:

Dec. 07, 2009
Applicants:

Volker Seyfried, Nussloch, DE;

Jochen Sieber, Mannheim, DE;

Inventors:

Volker Seyfried, Nussloch, DE;

Jochen Sieber, Mannheim, DE;

Assignee:

Leica Microsystems CMS GmbH, Wetzlar, DE (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01); G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for high spatial resolution stochastic examination of a biological sample structure labeled with a labeling substance is described. The method comprises providing a biological sample structure; choosing such a labeling substance that has molecules present in a first state and in a second state, and the first and second states differ from one another in at least one photophysical property such that there is sufficient probability that one portion of the molecules of the substance will be in the first state and another portion of the molecules will be in the second state and within which labeling substance a change of the state of the molecules can occur spontaneously between the two states in both directions; and labeling the biological sample structure with the substance.


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