The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Mar. 26, 2008
Juan Jenny LI, Basking Ridge, NJ (US);
David Mandel Weiss, Long Valley, NJ (US);
Juan Jenny Li, Basking Ridge, NJ (US);
David Mandel Weiss, Long Valley, NJ (US);
Avaya Inc., Basking Ridge, NJ (US);
Abstract
A technique is disclosed for determining off-line the number and location of instrumentation probes to be inserted into a program under testing, and subsequently instrumenting the program at run-time based on the off-line analysis. In accordance with the illustrative embodiment, an off-line analyzer first determines instrumentation locations for a program under test in accordance with a method called the Super Nested Block Method. After the instrumentation locations have been determined, a testing/monitoring tool executes the program and a run-time instrumenter in parallel. The run-time instrumenter accordingly inserts probes into the program, removes probes after they have been executed once, and generates and reports information about code coverage based on the probes.