The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Jun. 19, 2008
Nicola Bruski, Paderborn, DE;
Ralf G Boerger, Paderborn, DE;
Robert Leinfellner, Paderborn, DE;
Eduard Miller, Salzkotten, DE;
Thomas Woelfer, Paderborn, DE;
Nicola Bruski, Paderborn, DE;
Ralf G Boerger, Paderborn, DE;
Robert Leinfellner, Paderborn, DE;
Eduard Miller, Salzkotten, DE;
Thomas Woelfer, Paderborn, DE;
dSPACE digital signal processing and control engineering GmbH, Paderborn, DE;
Abstract
The present invention relates to a test device for testing a control system and an associated method for operating the test device. The test device includes an addressable memory. The test device is configured to calculate at least one environment model and to execute at least one test model. The environment model is described by environment model variables whose values are filed at fixed physical addresses in memory locations of the memory. The test device further comprises an allocation unit, in which the allocation of all or a part of the environment model variable to the allocated physical addresses of the memory is filed such that the test model can read the allocation of the environment model variables to their specific memory addresses so as to modify the environment model variable values in the environment model during its execution.