The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2012

Filed:

Nov. 02, 2009
Applicants:

Hakeem Akinmade Yusuff, Hopewell Junction, NY (US);

John A. Fitzsimmons, Hopewell Junction, NY (US);

Ranee Wai-ling Kwong, Hopewell Junction, NY (US);

Inventors:

Hakeem Akinmade Yusuff, Hopewell Junction, NY (US);

John A. Fitzsimmons, Hopewell Junction, NY (US);

Ranee Wai-Ling Kwong, Hopewell Junction, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 33/44 (2010.01); H01L 51/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a structure for reworking an antireflective coating (ARC) layer over a semiconductor substrate. The method includes providing a substrate having a material layer, forming a planarization layer on the material layer, forming an organic solvent soluble layer on the planarization layer, forming an ARC layer on the organic solvent soluble layer, forming a pattern in the ARC layer, and removing the organic solvent soluble layer and the ARC layer with an organic solvent while leaving the planarization layer unremoved. The structure includes a substrate having a material layer, a planarization layer on the material layer, an organic solvent soluble layer on the planarization layer, and an ARC layer on the organic solvent soluble layer.


Find Patent Forward Citations

Loading…