The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Jun. 01, 2010
Yuk Ming Dennis Lo, Kowloon, HK;
Rossa Wai Kwun Chiu, New Territories, HK;
Stephen Siu Chung Chim, Quarry Bay, HK;
Chunming Ding, New Territories, HK;
Kwan Chee Chan, Kowloon, HK;
Hing Nam Ivy Wong, New Territories, HK;
Ka Chun Ryan Yuen, New Territories, HK;
Yuk Ming Dennis Lo, Kowloon, HK;
Rossa Wai Kwun Chiu, New Territories, HK;
Stephen Siu Chung Chim, Quarry Bay, HK;
Chunming Ding, New Territories, HK;
Kwan Chee Chan, Kowloon, HK;
Hing Nam Ivy Wong, New Territories, HK;
Ka Chun Ryan Yuen, New Territories, HK;
The Chinese University of Hong Kong, Hong Kong, SAR, CN;
Abstract
This application describes the discovery that, in a pregnant woman, certain genes (such as RASSF1A, APC, CASP8, RARB, SCGB3A1, DAB2IP, PTPN6, THY1, TMEFF2, and PYCARD) originated from a fetus are highly methylated, whereas the same genes of maternal origin are unmethylated. This discovery allows the easy detection of one or more of these methylated fetal genes in a biological sample from a pregnant woman, serving as a universal indicator of the presence of fetal DNA in the sample. These fetal methylation markers are particularly useful as positive controls for a non-invasive analytical process during which the quality and quantity of fetal DNA are monitored. These newly identified fetal markers can also be measured directly for diagnosis of certain pregnancy-related conditions.