The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Aug. 25, 2009
Applicants:
Wilfred Marcellien Bourg, Jr., Melissa, TX (US);
Enrique Michel, Dallas, TX (US);
Inventors:
Wilfred Marcellien Bourg, Jr., Melissa, TX (US);
Enrique Michel, Dallas, TX (US);
Assignee:
Frito-Lay North America, Inc., Plano, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention is a method to detect defects in a process producing a food product by utilizing multivariate image analysis. In one aspect, an image is captured of the food product in the visible spectrum by on-line vision equipment, multivariate image analysis is performed on the image via an algorithm programmed onto a field programmable gate array to determine if a defect exists, a signal is sent to downstream sorting equipment, and the sorting equipment then rejects those food products that contain defects.