The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Nov. 18, 2008
Applicants:

Yeh-sheng Cheng, Yunlin County, TW;

Hsueh-wen Wang, Hsinchu, TW;

Shu-yun Liao, Hsinchu, TW;

Chih-ying Chien, Nantou County, TW;

Hsin-yu LU, Taichung, TW;

Rui-huang Cheng, Taipei County, TW;

Inventors:

Yeh-Sheng Cheng, Yunlin County, TW;

Hsueh-Wen Wang, Hsinchu, TW;

Shu-Yun Liao, Hsinchu, TW;

Chih-Ying Chien, Nantou County, TW;

Hsin-Yu Lu, Taichung, TW;

Rui-Huang Cheng, Taipei County, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/52 (2006.01); H01L 29/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test key for checking an interconnect structure is described, including a contiguous metal line and multiple conductive plugs on the contiguous metal line, wherein one end of each plug contacts with the contiguous metal line. The other end of at least one plug is not connected to any conductor. In addition, the two ends of the contiguous metal line are connected to different voltages.


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