The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8278210 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 02, 2012

Filed:

Mar. 05, 2010
Applicant:

Tatsuhiko Miura, Tokyo, JP;

Inventor:

Tatsuhiko Miura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a modern 0.15 μm power MOSFET, aluminum voids (voids formed in an aluminum-type electrode) are generated frequently in trench portions (source contact trenches) caused by the reduction of a cell pitch for refinement. It is considered to be attributable to the defects which are generated mainly due to a sudden increase of the aspect ratio from 0.84 in the previous generation to 2.8 in the current generation. Accordingly, concave portions of repetitive trenches having a high aspect ratio are filled with an aluminum-type metal by ionized sputtering throughout the processing, from the formation to the filling of an aluminum-type metal seed film.


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Miura, Tatsuhiko. (2012). Manufacturing method of semiconductor device (U.S. Patent No. 8278210). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8278210

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