The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2012
Filed:
Dec. 08, 2006
Vineet Wason, Mountain View, CA (US);
Jung-suk Goo, Los Altos, CA (US);
Zhi-yuan Wu, Union City, CA (US);
Ciby T. Thuruthiyil, Fremont, CA (US);
Vineet Wason, Mountain View, CA (US);
Jung-Suk Goo, Los Altos, CA (US);
Zhi-Yuan Wu, Union City, CA (US);
Ciby T. Thuruthiyil, Fremont, CA (US);
Globalfoundries Inc., Grand Cayman, KY;
Abstract
According to one exemplary embodiment, a method for robust statistical semiconductor device modeling includes building a semiconductor device model using at least one new device parameter variation, constructing a variation library for the semiconductor device model, and verifying the variation library against measured data from physical semiconductor devices. The variation library is constructed by determining variations of the at least one new device parameter variation and standard device parameters as functions of, for example. sizes and locations of semiconductor devices on semiconductor dies.