The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

Feb. 06, 2009
Applicants:

Gerald R. Talbot, Concord, MA (US);

Hanwoo C. Cho, Acton, MA (US);

Brian Amick, Brookline, MA (US);

Inventors:

Gerald R. Talbot, Concord, MA (US);

Hanwoo C. Cho, Acton, MA (US);

Brian Amick, Brookline, MA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 25/00 (2006.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A data processing device is configured so that, in a test mode of operation, the phase of an output signal of a second programmable delay module (PDM) is based on the phase of the input signal of the first PDM. To test the first and second PDMs, the output signal of the first PDM is set to each of a first set of phases and the corresponding phase of the output signal of the second PDM is compared to determine whether the performance of the first and second PDMs match a specification. Accordingly, the first and second PDMs are qualified based on their relative performance, reducing the need for test structures that consume an undesirably large amount of area.


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