The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2012
Filed:
Jun. 18, 2009
Applicants:
Shinji Yoshioka, Hitachinaka, JP;
Akihiro Takeda, Hitachinaka, JP;
Tsukasa Shishika, Mito, JP;
Inventors:
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a mass spectroscope employing electron capture dissociation wherein the peak number of detectable fragment ions is increased. The mass spectroscope comprises an ion source () for generating ions from a sample, an ion trap () for storing and selecting ions, an ion dissociation section () performing electron capture dissociation on ions, and a time-of-flight mass spectrometry section () performing mass spectrometry on ions, wherein the reaction time of electron capture dissociation is variable depending on the valence of ions subjected to mass spectrometry.