The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

May. 13, 2009
Applicants:

Kazuaki Kozasa, Nagasaki, JP;

Tomonori Kawasaki, Nagasaki, JP;

Inventors:

Kazuaki Kozasa, Nagasaki, JP;

Tomonori Kawasaki, Nagasaki, JP;

Assignee:

Sumco Techxiv Corporation, Omura-shi, Nagasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B44C 1/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of etching a semiconductor wafer is provided. The method comprises the steps of: jetting a mixed gas including hydrogen fluoride and ozone onto a surface of a semiconductor wafer; monitoring the surface of the semiconductor wafer; analyzing the surface of the semiconductor wafer; and adjusting at least one of the hydrogen fluoride concentration and the ozone concentration in the mixed gas based on a result of the analysis.


Find Patent Forward Citations

Kozasa, Kazuaki. (2012). Etching method and etching apparatus of semiconductor wafer (U.S. Patent No. 8273260). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8273260

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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