The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2012

Filed:

Dec. 25, 2008
Applicants:

Bengi Karacali-akyamac, Bridgewater, NJ (US);

Mark John Karol, Fair Haven, NJ (US);

Parameshwaran Krishnan, Basking Ridge, NJ (US);

Inventors:

Bengi Karacali-Akyamac, Bridgewater, NJ (US);

Mark John Karol, Fair Haven, NJ (US);

Parameshwaran Krishnan, Basking Ridge, NJ (US);

Assignee:

Avaya Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is disclosed for conducting a search in which measurements of a time-varying property are made and updated during the search, and in which the measurements might be uncertain. In accordance with the illustrative embodiment, one or more search algorithm parameters (e.g., the maximum branching factor of a search tree, a depth cutoff for a search tree, a time cutoff, a threshold, etc.) are adjusted dynamically during the search based on at least one of: the degree of uncertainty of the measurements, the variability of measurements over time (e.g., standard deviation, etc.), and the fraction of members whose measurement is better than a threshold. In addition, the illustrative embodiment enables the search space to be pruned based on these criteria.


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