The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2012

Filed:

Apr. 17, 2009
Applicants:

Ronald T. Kurnik, Foster City, CA (US);

Thomas Thurnherr, Lucerne, CH;

Inventors:

Ronald T. Kurnik, Foster City, CA (US);

Thomas Thurnherr, Lucerne, CH;

Assignee:

Roche Molecular Systems, Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for determining melting temperatures, Tm, for DNA from melt curve data. The systems and methods also allow for quantitative determination of gene amount based on peak height. A PCR analogy is used to perform quantization of an acquired melting curve dataset. The melting curve is transformed using a horizontal flip and a horizontal translation, and a double sigmoid equation is then fit to the data. Inverse translation and inverse horizontal flip transforms are applied to the equation to produce an equation based solution of the melt curve dataset. The equation based solution of the melt curve is then used to determine the first derivative (e.g., Tm value) and peak height.


Find Patent Forward Citations

Loading…