The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8264662 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 11, 2012

Filed:

Jun. 18, 2007
Applicants:

Li-jui Chen, Hsinchu, TW;

Tsai-sheng Gau, Hsinchu, TW;

Chi-kang Peng, Hsinchu, TW;

Inventors:

Li-Jui Chen, Hsinchu, TW;

Tsai-Sheng Gau, Hsinchu, TW;

Chi-Kang Peng, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 27/52 (2006.01); G03B 27/58 (2006.01); G03B 27/32 (2006.01); G03B 27/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

An immersion lithography system, comprising a lens unit configured to project a pattern from an end thereof and onto a wafer, a hood unit configured to confine an immersion fluid to a region of the wafer surrounding the end of the lens unit, a wafer stage configured to position the wafer proximate the end of the lens unit, and at least one of an image capturing apparatus and a scattering light detection apparatus, wherein the image capturing apparatus is coupled to the wafer stage and is configured to capture an image of a surface of the hood unit proximate the wafer stage, and wherein the scattering light detection apparatus is proximate the end of the lens unit and the hood unit and is configured to detect particles on a surface of the wafer stage.


Find Patent Forward Citations

Chen, Li-Jui. (2012). In-line particle detection for immersion lithography (U.S. Patent No. 8264662). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8264662

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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