The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Oct. 01, 2008
Prakash Gopalakrishnan, Allison Park, PA (US);
Rongchang Yan, New Kensington, PA (US);
Akshat H. Shah, Pittsburgh, PA (US);
David N. Dixon, Allison Park, PA (US);
Keith Dennison, Edinburgh, GB;
Prakash Gopalakrishnan, Allison Park, PA (US);
Rongchang Yan, New Kensington, PA (US);
Akshat H. Shah, Pittsburgh, PA (US);
David N. Dixon, Allison Park, PA (US);
Keith Dennison, Edinburgh, GB;
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
Techniques are presented for accounting for parasitics in the automated design of integrated circuits. In one set of techniques, model values for parasitic models are received on a schematic environment from a user, the parasitic models are evaluated from the schematic using the received model values, the parasitic models are transferred to a layout environment, and the transferred parasitic models are evaluated on the layout environment. In other techniques, model values are received for parasitic models from a user, the parasitic models are evaluated on the layout environment, and the process then backannotates the parasitic models evaluated on the layout environment and corresponding parameter values to a schematic environment. In yet other techniques, a user is presented with a simulation environment within which the user is provided a choice to select between parasitic simulation modes of varying accuracy, the modes including a mode without parasitics and a plurality of modes including parasitics with a varying degree of accuracy. A selection from among the modes is received from the user and simulation test are performed at the selected degree of accuracy.