The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2012

Filed:

Aug. 13, 2008
Applicants:

Chun-hsiung Hung, Hsinchu, TW;

Wen-chiao Ho, Tainan, TW;

Kuen-long Chang, Taipei, TW;

Inventors:

Chun-Hsiung Hung, Hsinchu, TW;

Wen-Chiao Ho, Tainan, TW;

Kuen-Long Chang, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and circuit for testing a multi-chip package is provided. The multi-chip package includes at least a memory chip, and the memory chip includes a number of memory cells. The method includes performing a normal read operation on the memory cells to check if data read from the memory cells is the same with preset data in the memory cells; and performing a special read operation on the memory cells to check if data read from the memory cells is the same with an expected value, wherein the expected value is independent from data stored in the memory cells.


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Hung, Chun-Hsiung. (2012). Method and circuit for testing a multi-chip package (U.S. Patent No. 8259521). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8259521

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