The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Dec. 26, 2007
Nitin Agarwal, Uttar Pradash, IN;
Nitin Agarwal, Uttar Pradash, IN;
STMicroelectronics International N.V., Amsterdam, NL;
Abstract
A method and a circuit for measuring an on chip duty cycle. The circuit includes a capacitor, a switching circuit, a current source, a comparator circuit and a counter. The circuit receives a first clock signal and a second clock signal. The first clock signal has a 50% duty cycle and the second signal has an unknown duty cycle signal. The switching circuit first receives the first clock signal and then the second clock signal for measuring the duty cycle. The comparator circuit compares a comparator voltage with a reference voltage for the first clock signal to measure a first elapsed cycle using the counter. The comparator circuit again compares a comparator voltage with a reference voltage for the second clock signal to measure a second elapsed cycle using the counter. The counter measures the first elapsed cycle and the second elapsed cycle corresponding to the first clock signal and the second clock signal for a duration in which the comparator voltage equals the reference voltage. The duty cycle for the second clock signal is then calculated using the first elapsed cycle and the second elapsed cycle.