The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Nov. 25, 2009
Vishnu Vardhan Krishnamachari, Mannheim, DE;
William C. Hay, Heppenheim, DE;
Volker Seyfried, Nussloch, DE;
Bernd Widzgowski, Dossenheim, DE;
Vishnu Vardhan Krishnamachari, Mannheim, DE;
William C. Hay, Heppenheim, DE;
Volker Seyfried, Nussloch, DE;
Bernd Widzgowski, Dossenheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
An optical evaluation method and an apparatus for performing said method are described. First laser pulses of a first type and second laser pulses of a second type that differs from the first type are sent onto a sample to be examined. The sample is hit with first incident light from the two laser pulses in at least one manner of simultaneously, within a very short time lag between the two laser pulses, and a time-correlated manner of the two laser pulses, thereby generating a first optical signal, and hit with second incident light from the two laser pulses, thereby generating a second optical signal. The generated first and second optical signals are detected with at least one detector; and an electronic difference between the first and second optical signals is generated.