The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2012

Filed:

Oct. 28, 2009
Applicant:

Hiroyasu Futamura, Omura, JP;

Inventor:

Hiroyasu Futamura, Omura, JP;

Assignee:

Sumco Techxiv Corporation, Omura-Shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 7/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A double-side grinding apparatus is designed to be capable of minimizing thermal expansion of hydrostatic pad members and reducing nanotopography in performing wafer grinding. The double-side grinding apparatus is a double-side grinding apparatus for wafers that can simultaneously grind either surface of a wafer to be ground by pressing a grindstone against either surface of the wafer to be ground while hydrostatically supporting either surface of the wafer to be ground in a noncontact manner. Each hydrostatic supporting unit is formed with a hydrostatic pad member facing the wafer to be ground, and a base member placed on the back surface of the hydrostatic pad member. The hydrostatic pad member is made of a ceramic member, and the base member is made of a metal member.


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Futamura, Hiroyasu. (2012). Double-side grinding apparatus for wafer and double-side grinding method (U.S. Patent No. 8251778). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8251778

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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