The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

Sep. 15, 2009
Applicants:

Robert G. Blankenship, Tacoma, WA (US);

Dennis W. Brzezinski, Sunnyvale, CA (US);

Edwin F. Mendez Valverde, Folsom, CA (US);

Inventors:

Robert G. Blankenship, Tacoma, WA (US);

Dennis W. Brzezinski, Sunnyvale, CA (US);

Edwin F. Mendez Valverde, Folsom, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An embodiment may include circuitry that may detect and/or correct at least one error in a data codeword that may include a data word, cyclical redundancy check (CRC) word, and parity word. The circuitry may select whether a portion of the CRC word indicates whether only a single processor has accessed the data word. The data word, CRC word, and the parity word may be accessible in respective distinct memory device sets that each may include one or more respective memory devices. If the circuitry detects, based at least in part upon the data codeword and CRC word, a CRC error, and the at least one error includes fewer than a first predetermined number of errors, the circuitry may determine in which of the one or more respective memory devices in the memory device sets the at least one error resides and may correct the at least one error.


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