The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

Feb. 05, 2008
Applicants:

Izumi Saitoh, Hyogo, JP;

Masayuki Takahira, Hyogo, JP;

Toshio Kawakita, Hyogo, JP;

Yasuyuki Yoshioka, Hyogo, JP;

Inventors:

Izumi Saitoh, Hyogo, JP;

Masayuki Takahira, Hyogo, JP;

Toshio Kawakita, Hyogo, JP;

Yasuyuki Yoshioka, Hyogo, JP;

Assignee:

Shiongi & Co., Ltd., Osaka, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C07D 477/20 (2006.01); A61K 31/407 (2006.01); A61P 31/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Novel crystals of a pyrrolidylthiocarbapenem derivative having excellent stability is provided. According to the present invention, a crystal of (+)-(4R,5S,6S)-6-[(1R)-1-hydroxyethyl]-4-methyl-7-oxo-3[[(3S,5S)-5-(sulfamoylaminomethyl)p yrrolidin-3-yl]thio]-1-azabicyclo[3.2.0]hept-2-ene-2-carboxylic acid having a diffraction pattern in powder X-ray diffraction having main peaks at diffraction angles (2θ) of about 13.04, 14.98, 15.88, 16.62, 20.62, 21.06, 22.18, 23.90, 26.08, 28.22 and 28.98 (degrees) and a crystal of said compound having a diffraction pattern in powder X-ray diffraction having main peaks at diffraction angles (2θ) of about 6.62, 13.04, 15.44, 16.58, 17.64, 20.88, 23.26, 25.02 and 25.52 (degrees) are provided.


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