The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

Aug. 14, 2007
Applicants:

Markus Jucker, Renton, WA (US);

Philip T. Feldsine, Mercer Island, WA (US);

Andrew Lienau, Seattle, WA (US);

Inventors:

Markus Jucker, Renton, WA (US);

Philip T. Feldsine, Mercer Island, WA (US);

Andrew Lienau, Seattle, WA (US);

Assignee:

BioControl Systems, Inc., Bellevue, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/569 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates generally to methods for detecting and identifying microorganisms and, more particularly, to methods for detecting microorganisms in a sample by incubating the sample at two temperatures to facilitate increased detection of the organism.


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