The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

Sep. 01, 2006
Applicants:

Noriko Maeda, Hitachinaka, JP;

Kyoko Imai, Hitachinaka, JP;

Taku Sakazume, Hitachinaka, JP;

Yukie Tokiwa, Hitachinaka, JP;

Kantaro Suzuki, Mito, JP;

Inventors:

Noriko Maeda, Hitachinaka, JP;

Kyoko Imai, Hitachinaka, JP;

Taku Sakazume, Hitachinaka, JP;

Yukie Tokiwa, Hitachinaka, JP;

Kantaro Suzuki, Mito, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automatic analyzer and an automatic analyzing system to identify samples and reagents used in the analyzer and members used in measurement of at least two objects in common: system reagents or buffer solution; sensor parts; probes; nozzles; chips; dispensing cups; tubes; ISE electrodes; detectors; deionized water; and waste, and to unify management of identification information thereof and a measurement result.


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