The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2012

Filed:

Apr. 13, 2009
Applicants:

Hidenosuke Itoh, Tokyo, JP;

Yoshikatsu Ichimura, Tokyo, JP;

Takashi Nakamura, Yokohama, JP;

Aya Imada, Tokyo, JP;

Inventors:

Hidenosuke Itoh, Tokyo, JP;

Yoshikatsu Ichimura, Tokyo, JP;

Takashi Nakamura, Yokohama, JP;

Aya Imada, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/06 (2006.01); G21K 1/10 (2006.01); G01T 1/36 (2006.01); G02B 26/06 (2006.01); G02F 1/017 (2006.01);
U.S. Cl.
CPC ...
Abstract

A source grating for X-rays and the like which can enhance spatial coherence and is used for X-ray phase contrast imaging is provided. The source grating for X-rays is disposed between an X-ray source and a test object and is used for X-ray phase contrast imaging. The source grating for X-rays includes a plurality of sub-gratings formed by periodically arranging projection parts each having a thickness shielding an X-ray at constant intervals. The plurality of sub-gratings are stacked in layers by being shifted.


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