The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8243838 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 14, 2012

Filed:

Feb. 04, 2010
Applicant:

Taro Osumi, Gunma, JP;

Inventor:

Taro Osumi, Gunma, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04K 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a measurement apparatus that measures power of an orthogonal frequency division multiplexing modulated signal (OFDM modulated signal) output from a transmitting device, comprising an output control section that causes the transmitting device to output the OFDM modulated signal having a prescribed waveform that repeats in each of a plurality of repetition periods; and a power measuring section that measures, over a measurement period that corresponds to an integer multiple of the repetition period, the power of the OFDM modulated signal output by the transmitting device. The output control section may cause the transmitting device to output the OFDM modulated signal having, as the repetition period, a period for which the arrangement of a pilot signal is the same in a direction of sub-carriers and a direction of OFDM symbols.


Find Patent Forward Citations

Osumi, Taro. (2012). Test apparatus and program (U.S. Patent No. 8243838). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8243838

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