The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Nov. 02, 2009
Nigel Chan, Munich, DE;
Wolf Allers, Munich, DE;
Michael Bollu, Kirchheim, DE;
Dimitri Lebedev, Dachau, DE;
Jan Otterstedt, Unterhaching, DE;
Christian Peters, Vaterstetten, DE;
Nigel Chan, Munich, DE;
Wolf Allers, Munich, DE;
Michael Bollu, Kirchheim, DE;
Dimitri Lebedev, Dachau, DE;
Jan Otterstedt, Unterhaching, DE;
Christian Peters, Vaterstetten, DE;
Infineon Technologies AG, Neubiberg, DE;
Abstract
A method of operating an integrated circuit includes applying at least one first programming pulse to a plurality of non-volatile memory cells to adjust a level of a storage parameter of each of the non-volatile memory cells, the at least one first programming pulse defined by a plurality of pulse parameters each having a fixed valued, and determining a fail count by measuring the number of non-volatile memory cells of the plurality of non-volatile memory cells having a storage parameter level exceeding a verify level. The method further includes determining a change in an programming behavior of the plurality of non-volatile memory cells based on the fail count, adjusting a value of at least one pulse parameter of at least one second programming pulse defined by the plurality of pulse parameters to a desired value based on the change in programming behavior, and applying the at least one second programming pulse to the plurality non-volatile memory cells.