The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2012

Filed:

Dec. 07, 2007
Applicants:

Krishnan Srinivasan, Cupertino, CA (US);

Chien-chun Chou, Saratoga, CA (US);

Drew Wingard, Palo Alto, CA (US);

Inventors:

Krishnan Srinivasan, Cupertino, CA (US);

Chien-Chun Chou, Saratoga, CA (US);

Drew Wingard, Palo Alto, CA (US);

Assignee:

Sonics, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various methods and apparatuses are described that provide instrumentation and analysis of an electronic design. A method for providing performance instrumentation and analysis of the electronic design includes defining a first and second set of intended software instrumentation test points and an associated first and second set of performance analysis units. The method further includes instrumenting the first and second sets of software instrumentation test points and the associated first and second sets of performance analysis units to a first model and a second model, respectively. The method further includes creating a first and a second set of software instances associated with the first and second sets of intended software instrumentation test points and associated sets of performance analysis units during run time of a first simulation and a second simulation of the electronic design associated with the first model and second model, respectively.


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