The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Jun. 10, 2008
Applicants:
Masayuki Kawabata, Tokyo, JP;
Takayuki Akita, Tokyo, JP;
Eiji Kanoh, Tokyo, JP;
Inventors:
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/23 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a sampling apparatus that samples a signal under measurement, including a clock control section that generates a plurality of sampling clocks at a plurality of sampling phases at determined non-uniform intervals, so as to cancel out replicas in a sampling band that are not observation targets, from among the replicas of the signal under measurement and the replicas of the negative frequency component of the signal under measurement, in each sampling repetition cycle; and a sampling section that samples the signal under measurement with each of the plurality of sampling clocks.