The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2012

Filed:

Dec. 31, 2009
Applicants:

Hideyuki Nakagawa, Tsukuba, JP;

Nobuhiro Ishikawa, Best, NL;

Inventors:

Hideyuki Nakagawa, Tsukuba, JP;

Nobuhiro Ishikawa, Best, NL;

Assignee:

Mitutoyo Corporation, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 17/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

A coordinate measuring machine includes: a probe that has a contact point capable of movement within a predetermined range; a movement mechanism for moving the probe; and a controller for controlling the movement mechanism. The controller has a measurement value calculating unit for calculating a position of the contact point based on a displacement of the movement mechanism and a displacement of the probe. The measurement value calculating unit includes: a correction parameter calculator for calculating a correction parameter for correcting the displacement of the probe based on a measurement condition in measuring an object; a corrector for correcting the displacement of the probe based on the correction parameter; and a displacement synthesizing unit that synthesizes the displacement of the movement mechanism and the displacement of the probe corrected by the corrector to calculate the position of the contact point.


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