The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Jul. 10, 2009
Hsin-fei Meng, Hsinchu, TW;
Sheng-fu Hong, Hsinchu, TW;
Yu-chiang Chao, Hsinchu, TW;
Chien-cheng Liu, Hsinchu, TW;
Wen-hsing Liu, Hsinchu, TW;
Cheng-chung Chang, Hsinchu, TW;
Jan-hao LI, Hsinchu, TW;
Ming-zhi Dai, Hsinchu, TW;
Hsin-Fei Meng, Hsinchu, TW;
Sheng-Fu Hong, Hsinchu, TW;
Yu-Chiang Chao, Hsinchu, TW;
Chien-Cheng Liu, Hsinchu, TW;
Wen-Hsing Liu, Hsinchu, TW;
Cheng-Chung Chang, Hsinchu, TW;
Jan-Hao Li, Hsinchu, TW;
Ming-Zhi Dai, Hsinchu, TW;
National Chiao Tung University, Hsinchu, TW;
Abstract
The invention provides a label-free sensor that includes a substrate, a first electrode formed on the substrate, a second electrode formed on the substrate and spaced away from the first electrode, and a semiconductor layer formed on the substrate and being in contact with the first electrode and the second electrode. The semiconductor layer has a plurality of probe groups bonded to the semiconductor layer by functionalization, for sensing a coupling-specific substance having bonding specificity with the probe groups. The semiconductor layer is bonded with the probe groups, and the detection of detected object is performed in an instant, quick, rapid, and sensitive manner by measuring variation in electric current, avoiding the use of fluorescent reading equipment for reading fluorescent signals.