The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Mar. 14, 2005
Hideo Kashima, Kokubunji, JP;
Yasuaki Takada, Kiyose, JP;
Izumi Waki, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A technology for collecting a granular substance adhering to a baggage with high rate without touching the substance and inspecting whether a dangerous or specific sample material is adhered to the baggage. A method for simplifying or automating such an inspection is also provided. An adhering matter inspection equipment () is characterized in that the equipment comprises a collecting section () for collecting a sample material peeled off from an inspection object () whereupon the sample material is adhered by blowing compression gas through a capturing filter (), and an inspecting section () for analyzing the sample material captured by the capturing filter (), and further characterized in that the inspection equipment comprises a section () for delivering a baggage to the inspecting section (), and a carrying section () for carrying the capturing filter () from the capturing section () to the inspecting section ().