The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Feb. 11, 2010
Klaus Lamberg, Schwaney, DE;
Christine Thiessen, Paderborn, DE;
Matthias Schnelte, Paderborn, DE;
dSPACE digital signal processing and control engineering GmbH, Paderborn, DE;
Abstract
A method is described and represented for testing a control apparatus with a test device, where the control apparatus has at least one state variable and at least one actual functionality that contains a time dependency, and the control apparatus and the test device are connected to each other via a signal interface. The problem of the present invention is to prevent—at least partially—the disadvantages known from the state of the art, and, particularly, to provide a method for testing a control apparatus, which allows as simple and flexible an acquisition of the target functionality of a control apparatus is possible, and which takes into account the time dependency of the target functionality as comprehensively as possible during the test case generation.