The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Jul. 29, 2008
Gerald K Bartley, Rochester, MN (US);
Darryl J Becker, Rochester, MN (US);
Paul E Dahlen, Rochester, MN (US);
Philip R Germann, Oronoco, MN (US);
Andrew B Maki, Rochester, MN (US);
Mark O Maxson, Mantorville, MN (US);
John E. Sheets, Ii, Zumbrota, MN (US);
Gerald K Bartley, Rochester, MN (US);
Darryl J Becker, Rochester, MN (US);
Paul E Dahlen, Rochester, MN (US);
Philip R Germann, Oronoco, MN (US);
Andrew B Maki, Rochester, MN (US);
Mark O Maxson, Mantorville, MN (US);
John E. Sheets, II, Zumbrota, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, program product and apparatus include resistance structures positioned proximate security sensitive microchip circuitry. Alteration in the position, makeup or arrangement of the resistance structures may be detected and initiate an action for defending against a reverse engineering or other exploitation effort. The resistance structures may be automatically and selectively designated for monitoring. Some of the resistance structures may have different resistivities. The sensed resistance may be compared to an expected resistance, ratio or other resistance-related value. The structures may be intermingled with false structures, and may be overlapped or otherwise arranged relative to one another to further complicate unwelcome analysis.