The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
May. 21, 2009
Takaaki Suzuki, Hitachinaka, JP;
Masato Fukuda, Hitachinaka, JP;
Masahito Ito, Hitachinaka, JP;
Hitachi High-Technolgies Corporation, Tokyo, JP;
Abstract
Provided is a liquid chromatograph system and method configured to accurately obtain measurements by minimizing deviations in measurements due to a transfer from one measurement method to another measurement method. An aspect of the system and method includes minimizing deviations in measurements when a measurement method from a measurement system of a liquid chromatograph is transferred to measurement system under high pressure and high velocity. Such a transfer includes deviations due to differences in analysis conditions. The present subject matter uses a dwell volume value so as to minimize a deviation of measurement result due to methods before and after transfer. Another aspect includes calculating a correction value when there is a deviation in the measurement result, and automatically reflecting the correction value for the method transfer.