The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2012

Filed:

Dec. 26, 2006
Applicants:

Kiyotaka Ichiyama, Tokyo, JP;

Masahiro Ishida, Tokyo, JP;

Inventors:

Kiyotaka Ichiyama, Tokyo, JP;

Masahiro Ishida, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a jitter measurement apparatus to measure jitter of a signal under measurement. The jitter measurement apparatus includes a pulse generator that outputs a demodulated signal indicating the jitter of the signal under measurement, by outputting a pulse having a substantially constant pulse width in synchronization with each predetermined edge of the signal under measurement, a DC component detecting section that detects a DC component of the demodulated signal output from the pulse generator, and an adjusting section that adjusts the pulse width of the pulse output from the pulse generator, based on the DC component of the demodulated signal which is detected by the DC component detecting section.


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