The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Dec. 07, 2009
David L. Demaris, Austin, TX (US);
Timothy G. Dunham, South Burlington, VT (US);
William C. Leipold, Enosburg Falls, VT (US);
Daniel N. Maynard, Craftsbury Common, VT (US);
Michael E. Scaman, Goshen, NY (US);
Shi Zhong, Austin, TX (US);
David L. DeMaris, Austin, TX (US);
Timothy G. Dunham, South Burlington, VT (US);
William C. Leipold, Enosburg Falls, VT (US);
Daniel N. Maynard, Craftsbury Common, VT (US);
Michael E. Scaman, Goshen, NY (US);
Shi Zhong, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for generating test patterns for a pattern sensitive algorithm. The method comprises the steps extracting feature samples from a layout design; grouping feature samples into clusters; selecting at least one area from the layout design that covers a feature sample from each cluster; and saving each pattern layout covered by the at least one area as test patterns.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile