The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8190380 B1

PDF
Full Text
Expired
Date of Patent:
May. 29, 2012

Filed:

Sep. 23, 2011
Applicants:

Ray Choueiry, Rochester, NY (US);

Todd Heckleman, Spencerport, NY (US);

David J. Coumou, Webster, NY (US);

Inventors:

Ray Choueiry, Rochester, NY (US);

Todd Heckleman, Spencerport, NY (US);

David J. Coumou, Webster, NY (US);

Assignee:

MKS Instruments, Inc., Andover, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01); G01R 15/00 (2006.01); G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A metrology system monitors radio frequency (RF) power at a plurality of locations in a circuit. The system includes a plurality of RF sensors that generate respective analog signals based on electrical properties of the RF power, a multiplexing module that generates an output signal based on the analog signals, and an analysis module that generates messages based on the output signal. The messages contain information regarding the electrical properties that are sensed by the plurality of RF sensors.


Find Patent Forward Citations

Choueiry, Ray. (2012). Multipoint voltage and current probe system (U.S. Patent No. 8190380). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8190380

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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