The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Feb. 10, 2011
Applicants:
Tsuneo Nakagomi, Saitama, JP;
Norimitsu Matsusita, Saitama, JP;
Inventors:
Tsuneo Nakagomi, Saitama, JP;
Norimitsu Matsusita, Saitama, JP;
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/50 (2010.01); G01Q 60/56 (2010.01); G01N 13/22 (2006.01); G01N 13/16 (2006.01);
U.S. Cl.
CPC ...
Abstract
A magnetic head inspection method is provided with the step that an area smaller than a half of a scanning and measurement area of a magnetic probe in a cantilever unit of the MFM is set as a scanning and measurement area on a surface of a recording portion of the magnetic head that is scanned by the AFM, so as to greatly reduce the inspection time (tact time) of the AFM.
Nakagomi, Tsuneo. (2012). Magnetic head inspection method and magnetic head manufacturing method (U.S. Patent No. 8185968). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8185968
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile